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features

• PB6800 offers 12” dia. chuck for 300 mm arrays

• High volume production throughput

- Fast Quad Core Processor

- Distributed Processing

- Overlapped Tests

- Windows XP Operating System

• Motherboard/MUX Interface – No Cables

- 12,000 Channel Capability

- Kinematic coupling for high repeatability

- Fast motherboard and probe card change

- Software configurable relay control

• Enhanced high performance LED lighting

- Portable lighting recipes for all technologies

- Tests all probe card technologies

• Closed loop stage with 0.1µ encoders

- 12” x 8” stage travel for largest cards

- 300Kg force Z stage, 0.75” travel

• Powerful, easy to use software

- Simple test program generation

- e-Diagnostics Service Tool

- Built-in parameter plots

• 16 bit Precision Measurement Unit

- Highly accurate/repeatable analog measurements

- Polar & non-polar capacitors

- Series/parallel resistors

tests performed

• Leakage

• OD Leakage

• Capacitor Leakage

• Alignment

• Scrub Analysis

• Tip Diameter

• Planarity

• Contact Resistance

• Wire Check

• Gram Force

• Tip Depth

• Elevated Heat Levels with our Hot Chuck option

• Component Measurement for:

- Relays

- Capacitors

- Resistors